optical property

optical property

[′äp·tə·kəl ′präp·ərd·ē]
(electromagnetism)
One of the effects of a substance or medium on light or other electromagnetic radiation passing through it, such as absorption, scattering, refraction, and polarization.
(optics)
Also known as reflection property.
The property of an ellipse whereby rays of light emanating from one focus and reflected from a strip of polished metal at the ellipse come together at the other focus.
The property of a parabola whereby rays of light emanating from the focus and reflected from a strip of polished metal at the parabola are reflected parallel to the axis of the parabola, and likewise rays parallel to the axis of the parabola are reflected and brought together at the focus.
The property of a hyperbola whereby rays emanating from a focus and reflected from a strip of polished metal at the hyperbola appear to emanate from the other focus.
References in periodicals archive ?
Smart new operational features, such as an Optical Property Optimizer, simplify and streamline the process of method development, while a new result emulation tool eases the process of transferring methods from other particle sizing techniques.
All the materials in a foldable window unit (glasses and silicone rubber) must have almost the same optical properties and attach to each other strongly without any optical property change," Samsung's HongShik Shim told PhysOrg.
Other researchers have already detected a single electron's spin, for instance, by observing a shift in an atom's optical property.
We're seeing rapid development of new materials and applications in all the markets we serve, and we're positioning ourselves to be able to respond immediately to any film thickness or optical property measurement they can throw at us.
Normally, calcite has the optical property known as birefringence, in which light travels two pathways to produce a double image.
The system offers high precision film thickness measurement and optical property characterization of single and multiple transparent film stacks, using combined spectro-reflectometer and specto-ellipsometer technologies.
The system offers high precision film thickness measurement and optical property characterization of single and multiple dielectric film stacks, using combined spectro-reflectometer and spectro-ellipsometer technologies.