particle-induced x-ray emission
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particle-induced x-ray emission[′pärd·ə·kəl in¦düst ′eks‚rā i‚mish·ən]
A method of trace analysis in which a beam of ions is directed at a thin foil on which the sample to be analyzed has been deposited, and the energy spectrum of the resulting x-rays is measured.
McGraw-Hill Dictionary of Scientific & Technical Terms, 6E, Copyright © 2003 by The McGraw-Hill Companies, Inc.