pattern generator


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pattern generator

[′pad·ərn ‚jen·ə‚rād·ər]
(electronics)
A signal generator used to generate a test signal that can be fed into a television receiver to produce on the screen a pattern of lines having usefulness for servicing purposes.
References in periodicals archive ?
In software-based PA ATE, nondeterministic data must be captured, moved, and analyzed outside of the operation of the pattern generator.
The PG3A Digital Pattern Generator is sold by Tektronix but made by The Moving Pixel Company.
More information about the Agilent N4903A J-BERT pattern generator is available at www.
The Swedish laser pattern generators developer and manufacturer Micronic Laser Systems AB said on Wednesday (19 October) that it had received an exchange order from a customer in Asia.
The new BERTScope S Pattern Generator allows design and test engineers to generate calibrated, stressed data for jitter tolerance testing when either the device under test or a legacy BERT are used to measure bit error ratio.
The Swedish laser pattern generators maker Micronic Laser Systems AB said on Monday (3 October) that it had received a new order for an LRS series laser pattern generator from an Asian customer.
The product is based on the same production-proven technology as Micronic's laser pattern generators, the company said.
The 3,300-square-meter addition is part of a major expansion that includes a 750-square-meter clean room, an advanced e-beam pattern generator and state-of-the-art inspection equipment and process technology to support the growing Korean chip industry.
NORDIC BUSINESS REPORT-29 March 2005-Micronic Laser Systems AB wins photomask pattern generator order from Asian customer(C)1994-2005 M2 COMMUNICATIONS LTD http://www.
Internal Pseudo Random Bit Stream (PRBS) test pattern generator and monitoring function on each user interface module per STS-n/VC-n path on all SONET/SDH user interface modules, and per VT on the Channelized SONET/SDH and DS1/E1 and DS3 user interface modules
The dynamic algorithmic pattern generator (APG) and patented tester-per-site architecture provide up to four times improvement over existing systems in throughput for memory wafer sort.