reflection x-ray microscopy

reflection x-ray microscopy

[ri′flek·shən ¦eks‚rā mi′kräs·kə·pē]
(engineering)
A technique for producing enlarged images in which a beam of x-rays is successively reflected at grazing incidence, from two crossed cylindrical surfaces; resolution is about 0.5-1 micrometer.
McGraw-Hill Dictionary of Scientific & Technical Terms, 6E, Copyright © 2003 by The McGraw-Hill Companies, Inc.