scan path


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scan path

(circuit design) A technique used to increase the controllability and observability of a logic circuit by incorporating "scan registers" into the circuit. Normally these act like flip-flops but they can be switched into a "test" mode where they all become one long shift register. This allows data to be clocked serially through all the scan registers and out of an output pin at the same time as new data is clocked in from an input pin.

Using this technique, the state of certain points in the circuit can be examined and modified at any time by suspending normal operation and switching to test mode. If the scan path is placed adjacent to the circuit's input and output pins then this is known as "boundary scan".
References in periodicals archive ?
Tenders are invited for Code Composer Studio Version 6 Or Latest Version Floating 1 User Pack Tmdsccs All F01, Xds 510 Usb Galvanic Jtag Scan Path Emulator 701910
The scrambled image matrix obtained by using the scan path generated with W is shown in Fig.
All of the BIST logic can be tested via scan path and by logic BIST.
The three ultrasound sensors cover the entire document as it passes through the scan path.
This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occurring in the switching network.
All boundary scan cells are combined in a shift register with parallel inputs and outputs and generate the serial scan path.
In this experiment, two eye-movement measures were taken: number of fixations and scan path duration.
Included in the comparison were temporal eye movements, such as the number and duration of individual fixations, and spatial movements, such as scan path length.
An optional stand-alone light box allows the unit to verify bar code film masters on oversized substrates, and an 8" scan path accommodates a wide variety of symbol lengths and densities.
A visual scan path for each subject was then constructed based on the order in which the objects were reported.
3 is a flowchart of our data embedding phase, which involves three operations: determining the scan path and computing adjacent indices' differences, constructing the absolute difference tree and data embedding.