scan path

scan path

(circuit design) A technique used to increase the controllability and observability of a logic circuit by incorporating "scan registers" into the circuit. Normally these act like flip-flops but they can be switched into a "test" mode where they all become one long shift register. This allows data to be clocked serially through all the scan registers and out of an output pin at the same time as new data is clocked in from an input pin.

Using this technique, the state of certain points in the circuit can be examined and modified at any time by suspending normal operation and switching to test mode. If the scan path is placed adjacent to the circuit's input and output pins then this is known as "boundary scan".
References in periodicals archive ?
By computing a measure known as a fractal dimension on the individual participants scan path (map of eye movements) and performing a series of statistical calculations, the researchers were able to discern how the eye movements of the participants differed from mammogram to mammogram.
Las sacadas y las fijaciones son utiles para conformar un patron denominado scan path (Noton y Stark, 1971) producido por un estimulo.
At last, the corresponding scan path is planned to get the topography of the target.
Scan path means that the intraoral scanner must be used according to a specific movement to increase accuracy of the virtual model [6].
a tilt of the scan path with respect to the optimum scan direction along the pipe.
As shown in Figure 3(d), a laser beam was impinged on each point along the scan path in the area having a width LH and length [L.sub.V] with constant interval A.
All of the BIST logic can be tested via scan path and by logic BIST." (1)
The three ultrasound sensors cover the entire document as it passes through the scan path.
This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occurring in the switching network.
All boundary scan cells are combined in a shift register with parallel inputs and outputs and generate the serial scan path.
In this experiment, two eye-movement measures were taken: number of fixations and scan path duration.
Included in the comparison were temporal eye movements, such as the number and duration of individual fixations, and spatial movements, such as scan path length.