scanning electron microscope


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Related to scanning electron microscope: Transmission electron microscope

scanning electron microscope

[′skan·iŋ i′lek‚trän ′mī·krə‚skōp]
(electronics)
A type of electron microscope in which a beam of electrons, a few hundred angstroms in diameter, systematically sweeps over the specimen; the intensity of secondary electrons generated at the point of impact of the beam on the specimen is measured, and the resulting signal is fed into a cathode-ray-tube display which is scanned in synchronism with the scanning of the specimen. Abbreviated SEM.
References in periodicals archive ?
A compact scanning electron microscope (table unit) with EDX is required, with which particulate systems as well as solid surfaces are to be investigated and characterized.
Brion and HHT, the world's largest supplier of scanning electron microscopes for critical dimension (CD) measurement, are working with a joint customer, a large semiconductor manufacturer, to develop a common interface that works with Brion's Tachyon[TM] lithography simulation and design inspection tool and HHT's new DesignGauge CD-SEM system.
Acquisition and maintenance of a scanning electron microscope of a Schottky field effect gun.
Its cutting-edge scanning electron microscope delivers high quality and superior resolution images for ultra-sensitive detection of physical and electrical defects.
Provision of a FEG scanning electron microscope (SEM-FEG).
Examination with a scanning electron microscope and with a scanning tunneling microscope revealed that the film surface consists of sharp tips and steep facets formed by oriented crystals.
Contract notice: Scanning electron microscope to measure critical dimensions (cd-sem)).
Is a scanning electron microscope (SEM) image of a semiconductor line produced by a rectangular line of width w, or by a non-rectangular line of different width w'?
Studies with a scanning electron microscope and a laser scanning microscope revealed that the microstructure of the tooth's enamel also resembles that of a placental mammal.
LittleFoot(TM) is completely self-contained (no added modules are necessary), and will accomplish all these measurements simultaneously, with excellent correlation to CD Scanning Electron Microscope (CD-SEM) and Atomic Force Microscope (AFM) results.
Contract award notice: scanning electron microscope and field emission scanning, optional two inzahlunggabe used scanning electron microscopes.
A means of simulating electron trajectories and secondary generation in scanning electron microscope samples is an essential piece of the library-based linewidth measurement system being developed under contract with SEMATECH.

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