scanning electron microscope


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Related to scanning electron microscope: Transmission electron microscope

scanning electron microscope

[′skan·iŋ i′lek‚trän ′mī·krə‚skōp]
(electronics)
A type of electron microscope in which a beam of electrons, a few hundred angstroms in diameter, systematically sweeps over the specimen; the intensity of secondary electrons generated at the point of impact of the beam on the specimen is measured, and the resulting signal is fed into a cathode-ray-tube display which is scanned in synchronism with the scanning of the specimen. Abbreviated SEM.
References in periodicals archive ?
Purchase of a cryogenic plate with cryotransfert system for scanning electron microscope the services are divided into two parts: a firm slice (purchase of the cryogenic plate with cryotransfer system for a microscope scanning electronics); an optional slice (transfer of the system to meb jeol 7200 of the umr 6508 cnrs crismat)
Main features: acquisition of a scanning electron microscope for the lannion iut
The purpose of this contract is the supply , installation with training, delivery, commissioning , scalability, maintenance and warranty of a tablet scanning electron microscope (SEM) for the platform.
Invitation to tender: Scanning electron microscope based on a thermal (Schottky) field emitter
Is a scanning electron microscope (SEM) image of a semiconductor line produced by a rectangular line of width w, or by a non-rectangular line of different width w'?
A means of simulating electron trajectories and secondary generation in scanning electron microscope samples is an essential piece of the library-based linewidth measurement system being developed under contract with SEMATECH.
Lalueza Fox of the University of Barcelona in Spain used a scanning electron microscope to examine more than 80 front teeth from 20 Neandertals.
Tenders are invited for Procurement of integrated eds and ebds system for carl zeiss scanning electron microscope, qty 01 no
NIST has a new field-emission scanning electron microscope (FE-SEM) capable of high spatial resolution microstructural characterization of a wide variety of metal, ceramic, and polymer structures.
Invitation to tender: Scanning electron microscope equipped with a backscattered electron diffraction system and an energy dispersion spectrometer
Improved software for constructing predicted scanning electron microscope (SEM) images of line features has been produced.
Invitation to tender: Scanning electron microscope with an electron backscattering system and with an energy dispersive spectrometer

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