secondary ion mass spectrometer

secondary ion mass spectrometer

[′sek·ən‚der·ē ′ī‚än ′mas spek′tram·əd·ər]
(engineering)
An instrument for microscopic chemical analysis, in which a beam of primary ions with an energy in the range 5-20 kiloelectronvolts bombards a small spot on the surface of a sample, and positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer. Abbreviated SIMS. Also known as ion microprobe; ion probe.
References in periodicals archive ?
The cea grenoble wishes to equip itself with a time-of-flight secondary ion mass spectrometer (tof-sims) allowing the profilometry of the chemical elements on the nanometric scale, with a sensitivity to dopants and traces (concentration below the ppm) , for the devices of advanced electronics, alternative energies, nanosciences.
The technology eventually used to study the samples is known as secondary ion mass spectrometer (SIMS).
The new PS1m Time of Flight Secondary Ion Mass Spectrometer system (ToF-SIMS) being used by Bangor University's CLARET project is one of only a handful available for commercial use across the UK.
(15.) Gerlock, J.L., Prater, T.J., Kaberline, S.L., and deVries, J.E., "Assessment of Relative Photooxidation Rates in Multi-Layer Coating Systems by Time-of-Flight Secondary Ion Mass Spectrometer," Polym.
this spectrometer is intended to complement the xps instruments available in the "surface analysis" group of the "institute for applied materials / energy storage systems" (iam-ess) and, Together with the existing complementary time-of-flight secondary ion mass spectrometer, To provide years of surface analysis at the highest level.
Using a NanoSIMS (nanoscale secondary ion mass spectrometer), an instrument used to run very small-scale chemical analyses, they then observed the incorporation of oxygen-18 in the calcareous shells.
Contract notice: time of flight secondary ion mass spectrometer (tof-sims)
TAKE A SECONDARY ion mass spectrometer, already more surface sensitive than ESCA or Auger instruments, add a time-of-flight (TOF) spectrometer to it, and you have an instrument that sheds new light on both the chemistry and molecular distribution on the surfaces of materials.
To observe the etching progress and the endpoint detection of the layer removal, The device is to be equipped with a secondary ion mass spectrometer.
Friedbacher and a team of researchers at the Vienna Institute of Analytical Chemistry have just completed a research project to develop analytical techniques for tungsten, a key refractory metal, using a secondary ion mass spectrometer (SIMS).
Tenders are invited for Procurement, installation and commissioning of high resolution secondary ion mass spectrometer (hr-sims along with all required accessories,spares,consumablesincluding preparation of instrument room in geological survey of india, kolkata
The secondary ion mass spectrometer - wide geometry (LG-SIMS) is used for the detection of trace actinides or other items of interest present in environmental dust micromtrique.II.2.5 size) Award criteria

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