secondary ion mass spectrometer

secondary ion mass spectrometer

[′sek·ən‚der·ē ′ī‚än ′mas spek′tram·əd·ər]
(engineering)
An instrument for microscopic chemical analysis, in which a beam of primary ions with an energy in the range 5-20 kiloelectronvolts bombards a small spot on the surface of a sample, and positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer. Abbreviated SIMS. Also known as ion microprobe; ion probe.
References in periodicals archive ?
The technology eventually used to study the samples is known as secondary ion mass spectrometer (SIMS).
The new PS1m Time of Flight Secondary Ion Mass Spectrometer system (ToF-SIMS) being used by Bangor University's CLARET project is one of only a handful available for commercial use across the UK.
(15.) Gerlock, J.L., Prater, T.J., Kaberline, S.L., and deVries, J.E., "Assessment of Relative Photooxidation Rates in Multi-Layer Coating Systems by Time-of-Flight Secondary Ion Mass Spectrometer," Polym.
Using a NanoSIMS (nanoscale secondary ion mass spectrometer), an instrument used to run very small-scale chemical analyses, they then observed the incorporation of oxygen-18 in the calcareous shells.
TAKE A SECONDARY ion mass spectrometer, already more surface sensitive than ESCA or Auger instruments, add a time-of-flight (TOF) spectrometer to it, and you have an instrument that sheds new light on both the chemistry and molecular distribution on the surfaces of materials.
Friedbacher and a team of researchers at the Vienna Institute of Analytical Chemistry have just completed a research project to develop analytical techniques for tungsten, a key refractory metal, using a secondary ion mass spectrometer (SIMS).

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