shmoo plot


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shmoo plot

A graphical representation of selected test parameters in an electronic circuit where inputs such as voltage and clock frequency are constantly varied. The graph tends to show shifting, rounded curves that resemble the lumpy, bubble-shaped shmoo character in the Li'l Abner comic strip series. The term is also a verb: "to shmoo" is to run the test.
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In addition, the Shmoo Plot Tool can help you determine under what conditions your DUT stops working--you can set up shmoo conditions in advance and then determine the pass/fail transition point.
Additionally, ICEasy includes two-dimensional Shmoo plot capability (Figure 4)--providing users with the ability to characterize devices over a range of operating parameters." He said Marvin Test Solutions also offers the DIOEasy file import tool (DIOEasy-FIT) for importing VCD (value change dump), eVCD (extended VCD), WGL, and STIL test vectors for use with Marvin Test Solutions digital instrumentation plus a full-featured set of digital waveform edit and display tools.
Shmoo Plot A graph representing pass/fail test results that will plot pairs of test criteria such as frequency vs voltage, or voltage v temperature.
The new Digital Pattern Editor software integrates editing environments for device pin maps, specifications and patterns to develop test plans faster; built-in tools like multisite and multi-instrument pattern bursting to expand from development into production seamlessly; and tools like shmoo plots and an interactive pin view to debug and optimize tests more efficiently.
"During the past year," Dewey said, "we have spent significant effort developing software tools that simplify the development of semiconductor test programs." This tool set, called ICEasy, simplifies the development and deployment of semiconductor tests such as measurement of input/output DC parameters and the generation of I-V curve plots and shmoo plots. "These are all tests that are used during the verification and early production of devices," Dewey said.
Shmoo plots are routinely used by development and test engineers to evaluate digital devices under pattern test while one or more conditions are swept or varied.