Shown schematically in Figure 1, key components of the electrical crimp consolidation implementation include Model G II Terminating Machine (press)  and applicator, a condenser bank, and a trigger circuit
. The condenser bank comprises of an array of eight capacitors ranging from l00[mu]F through 1800[mu]F that are charged through a current-limited voltage source for independent adjustment of discharge energy (3.25-13J) and charging potential (60-180V).
The Schmitt Trigger circuit
has been widely used in the input buffers to increase noise immunity.
Several patents have been filed that describe oscillators in which the phase can be instantaneously altered in response to a control signal, such as the output from a trigger circuit
The Chinese authorities' seemingly capricious decision last week to trigger circuit
breakers, and then to rapidly remove them, added to the chaos in the country's stock exchanges and intensified unease about the world's second- largest economy and its commitment to free markets.
The benefits relative to the testing efforts of ATPG become worse if the input nodes for the HT's trigger circuit
are spread out throughout the system.
Schmitt Trigger Circuit
. Consider the Schmitt trigger circuit
of Figure 8(a), where the bipolar transistors are modelled using the simplified Ebers-Moll (see Figure 8(b)) model of NPN transistors as depicted in Figure 8(c).
The trigger circuit
; the part of the circuit that triggers the timer module.
Using a trigger circuit
, this information can be transformed easily into a binary signal and be used for further evaluation in the ECU, schematically illustrated in Figure 5.
"The voltage threshold for the trigger level in use by the trigger circuit
can be compared to the region proximate the trigger location in the acquisition record to determine by further local interpolation the precise location in the acquisition record where the triggering event should have occurred.
A high-speed direct bootstrapped CMOS Schmitt trigger circuit
. In the proceedings of the IEEE International Conference on Semiconductor Electronics, pp: 68-71.