x-ray fluorescence analysis


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x-ray fluorescence analysis

[′eks ‚rā flu̇′res·əns ə‚nal·ə·səs]
(spectroscopy)
A nondestructive physical method used for chemical elemental analysis in which a material is irradiated by photons or charged particles of sufficient energy to cause its elements to emit (fluoresce) characteristic x-ray line spectra.
References in periodicals archive ?
Semi-quantitative X-ray fluorescence analysis indicates trace amounts of Pr, As, Fe, Gd, Mn, Pb, Sm, U and Y.
Claisse, Principles of Quantitative X-Ray Fluorescence Analysis (London: Heyden, 1982), Chap.
Vladimirsky on our team we will be able to accelerate the pace of development of high-value commercial products, based on JMAR's leading-edge X-ray source technology, for a wide range of applications, including semiconductor lithography, nano-tomography, nano-size particle detection, low energy X-ray fluorescence analysis, and more.
Energy dispersive x-ray fluorescence analysis (EDXRFA) is based on the physical principle of the primary radiation of an X-ray tube exciting a sample to emit X-ray fluorescence radiation.
Its tiny, less than seven microns, X-ray source spot size also opens the door for JMAR to become a serious competitor in alternative major-market X-ray applications such as high resolution X-ray imaging, radiobiology, X-ray fluorescence analysis and micromachining.
The device is used for elemental analysis and microanalysis of crystalline and amorphous materials using x-ray fluorescence analysis and represents a vital source of basic information about the prepared materials.