electromigration

[i¦lek·trō·mī′grā·shən]

(analytical chemistry)

A process used to separate isotopes or ionic species by the differences in their ionic mobilities in an electric field.

(physical chemistry)

The movement of ions under the influence of an electrical potential difference.

electromigration

(electronics)

Mass transport due to momentum exchange between conducting electrons and diffusing metal atoms. Electromigration causes progressive damage to the metal conductors in an integrated circuit. It is characteristic of metals at very high current density and temperatures of 100C or more.

The term was coined by Professor Hilbert Huntington in the late 1950s because he didn't like the German use of the word "electrotransport".

Mass transoport occurs via the Einstein relation J=DFC/kT where F is the driving force for the transoport. For electromigraiton F is z*epj and z* is an electromigration parameter relating the momentum exchange and z is the charge of the "diffusing" species.

This article is provided by FOLDOC - Free Online Dictionary of Computing (foldoc.org)

References in periodicals archive

Bazinet, Electromigration Feasibility of Green Tea Catechins, J.

Global Trends of Electrodialysis Research during 1991-2014: a Bibliometric Analysis

This is because high voltage gradient causes the passage of high electric current, which leads to high electromigration with subsequent substantial transfer of momentum to the surrounding pore-fluid molecules [66].

Geochemical modeling of trivalent chromium migration in saline-sodic soil during lasagna process: impact on soil physicochemical properties

There could be significant increase in the electromigration resistance of copper without having to compromise with its conductivity.

Carbon nanotube composites for electronic packaging applications: a review

Bower, "Three dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion," Journal of the Mechanics and Physics of Solids, vol.

Analytical approach to model and diagnostic distribution of dopant in an implanted-heterojunction rectifier accounting for mechanical stress

Among the topics are conventional and advanced electron transmission microscopy, observing chemical reactions using transmission electron microscopy, in-situ transmission electron microscopy studies of oxidation, current-induced transport: electromigration, and cathodoluminescence in scanning and transmission electron microscopies.

In-situ electron microscopy; applications in physics, chemistry and materials science

Cu with its low resistivity and high electromigration resistance is one of the most attractive materials for future devices.

Effect of SiC on the corrosion resistance of electroless Cu-P-SiC composite coating

In addition to the abstracts, eight full papers report original research into positron annihilation in ion-implanted zinc oxide, optical characteristics of tungsten oxide thin films prepared by the sputtering technique, magnetization mechanisms of nano-magnetic fluid, the clustering of arsenic atoms in silicon during low-temperature annealing, effects of current density on the composition and microstructure of an electrodeposited silicon diffusion layer, positron annihilation and micro-hardness measurement of 6063 and 6066 alloys with compromise in ingot aluminum, the stress-induced migration and trapping of hydrogen in AISI403 steel, and electromigration force on a proton with a bound state.

Defects and diffusion in ceramics; an annual retrospective XI

For example, selective electromigration of the metals in the solder (SnPb) was evident between many capacitors.

Cleaning COTS parts in military applications: why commercial off-the-shelf components are incompatible with high-rel processes

Professor Cemal Basaran, the director of the Electronics Packaging Lab in UB's School of Engineering and Applied Sciences, says that the four years of quantum mechanics calculations performed by him and his doctoral student Tarek Ragab have proved that higher current density in carbon nanotubes does not lead to electromigration and thermomigration.

Carbon nanotubes may replace metals in electronic applications